Isolation and optoelectronic characterization of Si solar cells microstructure defects by Gajdos, A, Skarvada, P, Macku, R, Papez, N, Skvarenina, L, Sobola, D

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Structural properties of Al2O3/AlN thin film prepared by magnetron sputtering of Al in HF-activated nitrogen plasma by Dallaeva, D.S., Bilalov, B.A., Gitikchiev, M.A., Kardashova, G.D., Safaraliev, G.K., Tománek, P., Škarvada, P., Smith, S.

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Contact quality analysis and noise sources determination of CdZnTe-based high-energy photon detectors by Sik, O, Skarvada, P, Grmela, L, Elhadidy, H, Vondra, M, Sikula, J, Franc, J

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Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties by Šik, O., Bábor, P., Škarvada, P., Potoček, M., Trčka, T., Grmela, L., Belas, E.

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Study of electric field distribution and low frequency noise of CdZnTe radiation detectors by Sik, O, Grmela, L, Elhadidy, H, Dedic, V, Sikula, J, Grmela, P, Franc, J, Skarvada, P, Holcman, V

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Determining the sub-surface damage of CdTe single crystals after lapping by Šik, O., Škvarenina, L., Caha, O., Moravec, P., Škarvada, P., Belas, E., Grmela, L.

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Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency by Škarvada, Pavel, Grmela, Lubomír, Tománek, Pavel

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Noise of Reverse Biased Solar Cells by Skarvada, P, Macku, R, Koktavy, P, Raska, M

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Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy by Macku, R, Koktavy, P, Skarvada, P, Raska, M, Sadovsky, P

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Local investigation of monocrystalline silicon solar cells defects by Tomanek, P., Skarvada, P., Grmela, L., Macku, R., Smith, S. J.

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Microscopic optoelectronic defectoscopy of solar cells by Škarvada, P., Tománek, P., Koktavý, P., Dallaeva, D.

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Detection and Localization of Defects in Monocrystalline Silicon Solar Cell by Tománek, P., Škarvada, P., Macků, R., Grmela, L.

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Microstructure and Defects Evaluation of Varistors by Ultrasonic Waves in Low Frequency Range by Škarvada, Pavel, Cséfalvay, Gabriel, Sikula, Josef, Tofel, Pavel

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Cold field emission electrode as a local probe of proximal microscopes: Investigation of defects in monocrystalline silicon solar cells by Tománek, P., Škarvada, P., Dallaeva, D., Grmela, L., Macků, R., Smith, S.

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Light emission from silicon solar cells as characterization technique by Skarvada, P, Tomanek, P, Koktavy, P, Macku, R

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Fluctuations of ultrasonic transducer vibration measurement quadrature interferometer for transducer vibration measurement by Skarvada, P., Tomanek, P., Grmela, L., Tofel, P., Sevcik, M., Macku, R.

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Local light to electric energy conversion measurement of silicon solar cells by Skarvada, P., Tomanek, P., Macku, R.

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Study of the Influence of Structural Defects on Properties of Silicon Solar Cells by Sicner, Jiri, Skarvada, Pavel, Macku, Robert, Koktavy, Pavel

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Influence of Localized Structural Defects on the PN Junction Properties by Skarvada, Pavel, Tomanek, Pavel, Sicner, Jiri

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Non-Destructive Characterization of Micro-Sized Defects in the Solar Cell Structure by Škarvada, Pavel, Macku, Robert, Koktavý, Pavel

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