Trends in sputtering by Smentkowski, Vincent S.

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Matrix Implanted Laser Desorption Ionization (MILDI) Combined with Ion Mobility-Mass Spectrometry for Bio-Surface Analysis by Tempez, A, Ugarov, M, Egan, T, Schultz, J. A, Novikov, A, Della-Negra, S, Lebeyec, Y, Pautrat, M, Caroff, M, Smentkowski, V. S, Wang, H-Y. J, Jackson, S. N, Woods, A. S

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Multivariate Statistical Analysis of Concatenated Time-of-Flight Secondary Ion Mass Spectrometry Spectral Images. Complete Description of the Sample with One Analysis by Smentkowski, V. S, Keenan, M. R, Ohlhausen, J. A. (Tony), Kotula, P. G

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Multivariate Statistical Analysis of Three-Spatial-Dimension TOF-SIMS Raw Data Sets by Smentkowski, V. S, Ostrowski, S. G, Braunstein, E, Keenan, M. R, Ohlhausen, J. A. (Tony), Kotula, P. G

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Multivariate statistical analysis of non-mass-selected ToF-SIMS data by Smentkowski, V. S., Ostrowski, S. G., Kollmer, F., Schnieders, A., Keenan, M. R., Ohlhausen, J. A., Kotula, P. G.

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Elemental imaging by Pisonero, J, Bordel, N, Smentkowski, V. S

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Fluorination of Diamond Surfaces by Irradiation of Perfluorinated Alkyl Iodides by Smentkowski, V. S., Yates, John T.

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A comparison of multivariate statistical analysis protocols for ToF-SIMS spectral images by Smentkowski, V. S., Ostrowski, S. G., Keenan, M. R.

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Characterization of dilute species within CVD‐grown silicon nanowires doped using trimethylboron: protected lift‐out specimen preparation for atom probe tomography by PROSA, T. J., ALVIS, R., TSAKALAKOS, L., SMENTKOWSKI, V. S.

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Preparation of Self-Assembled Monolayers on InP by Gu, Y, Lin, Z, Butera, R. A, Smentkowski, V. S, Waldeck, D. H

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Improvements in Three-Dimensional Compositional Analysis of Complex Alloys by Ulfig, R, Oltman, E, Larson, DJ, Smentkowski, VS

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Effects of Substrate Modification in Wetting of Hydrophobic Materials in ESEM by Castagna, M., Rossi, M., Denault, L., Smentkowski, V.S.

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Atom Probe Tomography Analysis of Grain Boundaries in CdTe by Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Kelly, T.F., Smentkowski, V.S.

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Reduction of artifacts in temperature programmed desorption measurements of field generated, real-life, powered samples by Smentkowski, V. S., Linsebigler, A. L.

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New Applications in Atom Probe Tomography by Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Martin, I., Kelly, T.F., Smentkowski, V.S., Gordon, L.M., Joester, D., Inoue, K.

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Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate by Smentkowski, V.S., Duong, H.M., Tamaki, R., Keenan, M.R., Ohlhausen, J.A. Tony, Kotula, P.G.

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Deuterium atom interaction with diamond (100) studied by X-ray photoelectron spectroscopy by Smentkowski, V.S, Jänsch, H, Henderson, M.A, Yates, J.T

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Comparison of Sample Preparation Methods for Analysis of Biological Samples by High Vacuum Techniques by Denault, L, Ostrowski, SG, Smentkowski, VS, Paxon, TL

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Surface Versus Bulk Defects on Devices using Complementary Techniques by Smentkowski, VS, Ostrowski, SG, Denault, L, Woychik, CG

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Interaction of Cl2 with Fe(110) in the temperature range 90-1050 K by LINSEBIGLER, A. L, SMENTKOWSKI, V. S, ELLISON, M. D, YATES, J. T

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