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Radiation Defects and Carrier Lifetime in 4H‐SiC Bipolar Devices
by
Hazdra, Pavel
,
Smrkovský, Petr
,
Popelka, Stanislav
Published in
Physica status solidi. A, Applications and materials science
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Radiation Resistance of High-Voltage Silicon and 4H-SiC Power p-i-n Diodes
by
Hazdra, Pavel
,
Smrkovsky, Petr
,
Vobecky, Jan
,
Mihaila, Andrei
Published in
IEEE transactions on electron devices
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Ieee Transactions On Electron Devices
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Physica Status Solidi. A, Applications And Materials Science
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Subjects
Carrier Lifetime
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Physical Sciences
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Physics
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Physics, Applied
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Radiation Damage
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Radiation Effects
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Science & Technology
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Silicon Carbide
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Technology
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Carrier Recombination
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Circuits
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Deep Level Transient Spectroscopy
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Degradation
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Diodes
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Engineering
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Engineering, Electrical & Electronic
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Fast Neutrons
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Fluence
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Leakage Current
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Lifetime Control
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