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    A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies

    A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies by Ning, Zhenqiu, Sneyders, Yuri, Vanderbauwhede, Wim, Gillon, Renaud, Tack, Marnix, Raes, Paul

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