Search Results - Sogoyan, Armen V.

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  1. 1
    Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM

    Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM by Boruzdina, Anna B., Sogoyan, Armen V., Smolin, Anatoly A., Ulanova, Anastasia V., Gorbunov, Maxim S., Chumakov, Alexander I., Boychenko, Dmitry V.

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  2. 2
    SEE rate estimation based on diffusion approximation of charge collection

    SEE rate estimation based on diffusion approximation of charge collection by Sogoyan, Armen V., Chumakov, Alexander I., Smolin, Anatoly A.

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  3. 3
    A simple analytical model of single-event upsets in bulk CMOS

    A simple analytical model of single-event upsets in bulk CMOS by Sogoyan, Armen V., Chumakov, Alexander I., Smolin, Anatoly A., Ulanova, Anastasia V., Boruzdina, Anna B.

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  4. 4
    The Impact of the Polarization Orientation on Laser SEE Modeling in Complex ICs

    The Impact of the Polarization Orientation on Laser SEE Modeling in Complex ICs by Skorobogatov, Petr K., Sogoyan, Armen V., Davydov, Georgii G., Egorov, Andrey N., Savchenkov, Dmitriy V.

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  5. 5
    Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation

    Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation by Kessarinskiy, Leonid N., Boychenko, Dmitry V., Petrov, Andrey G., Nekrasov, Pavel V., Sogoyan, Armen V., Anashin, Vasily S., Chubunov, Pavel A.

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  6. 6
    Compendium of SEE comparative results under ion and laser irradiation

    Compendium of SEE comparative results under ion and laser irradiation by Chumakov, Alexander I., Pechenkin, Alexander A., Savchenkov, Dmitry V., Yanenko, Andrey V., Kessarinskiy, Leonid N., Nekrasov, Pavel V., Sogoyan, Armen V., Tararaksin, Alexander I., Vasil'ev, Alexey L., Anashin, Vasily S., Chubunov, Pavel A.

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