Search Results - Solecki, Jedrzej

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  1. 1
    Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns

    Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns by Mrugalski, Grzegorz, Rajski, Janusz, Rybak, Lukasz, Solecki, Jedrzej, Tyszer, Jerzy

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  2. 2
    Staggered ATPG with capture-per-cycle observation test points

    Staggered ATPG with capture-per-cycle observation test points by Liu, Yingdi, Rajski, Janusz, Reddy, Sudhakar M., Solecki, Jedrzej, Tyszer, Jerzy

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  3. 3
    Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

    Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs by Benware, Brady, Mrugalski, Grzegorz, Pogiel, Artur, Rajski, Janusz, Solecki, Jędrzej, Tyszer, Jerzy

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  4. 4
    Logic BIST With Capture-Per-Clock Hybrid Test Points

    Logic BIST With Capture-Per-Clock Hybrid Test Points by Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Zawada, Justyna

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  5. 5
    Trimodal Scan-Based Test Paradigm

    Trimodal Scan-Based Test Paradigm by Mrugalski, Grzegorz, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Chen Wang

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  6. 6
    Time and Area Optimized Testing of Automotive ICs

    Time and Area Optimized Testing of Automotive ICs by Mukherjee, Nilanjan, Tille, Daniel, Sapati, Mahendar, Liu, Yingdi, Mayer, Jeffrey, Milewski, Sylwester, Moghaddam, Elham, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

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  7. 7
    Low-Power Programmable PRPG With Test Compression Capabilities

    Low-Power Programmable PRPG With Test Compression Capabilities by Filipek, Michal, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Nadeau-Dostie, Benoit, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

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  8. 8
    Full-scan LBIST with capture-per-cycle hybrid test points

    Full-scan LBIST with capture-per-cycle hybrid test points by Milewski, Sylwester, Mukherjee, Nilanjan, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Zawada, Justyna

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  9. 9
    Test Time and Area Optimized BrST Scheme for Automotive ICs

    Test Time and Area Optimized BrST Scheme for Automotive ICs by Mukherjee, Nilanjan, Tille, Daniel, Sapati, Mahendar, Liu, Yingdi, Mayer, Jeffrey, Milewski, Sylwester, Moghaddam, Elham, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

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  10. 10
    TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm

    TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm by Mrugalski, Grzegorz, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Chen Wang

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  11. 11
    Diagnosis of failing scan cells through orthogonal response compaction

    Diagnosis of failing scan cells through orthogonal response compaction by Benware, Brady, Mrugalski, Grzegorz, Pogiel, Artur, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

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  12. 12
    Diagnosis of Failing Scan Cells through Orthogonal Response Compaction

    Diagnosis of Failing Scan Cells through Orthogonal Response Compaction by Benware, B., Mrugalski, G., Pogiel, A., Rajski, J., Solecki, J., Tyszer, J.

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