Search Results - Soley, D.E.J.

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    2 dimensional electron gas uniformity of GaN HFET layers on SiC

    2 dimensional electron gas uniformity of GaN HFET layers on SiC by Wallis, D.J., Wright, P.J., Soley, D.E.J., Koker, L., Uren, M.J., Martin, T.

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  2. 2
    An MBE growth facility for real‐time in situ synchrotron x‐ray topography studies of strained‐layer III–V epitaxial materials

    An MBE growth facility for real‐time in situ synchrotron x‐ray topography studies of strained‐layer III–V epitaxial materials by Whitehouse, C. R., Barnett, S. J., Soley, D. E. J., Quarrell, J., Aldridge, S. J., Cullis, A. G., Emeny, M. T., Johnson, A. D., Clarke, G. F., Lamb, W., Tanner, B. K., Cottrell, S., Lunn, B., Hogg, C., Hagston, W.

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