Search Results - Somayaji, Jhnanesh

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    Device, Circuit, and Reliability Assessment of Drain-Extended FinFETs for Sub-14 nm System on Chip Applications

    Device, Circuit, and Reliability Assessment of Drain-Extended FinFETs for Sub-14 nm System on Chip Applications by Kumar, B. Sampath, Ajay, Paul, Milova, Somayaji, Jhnanesh, Gossner, Harald, Shrivastava, Mayank

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  2. 2
    Performance and Reliability Codesign for Superjunction Drain Extended MOS Devices

    Performance and Reliability Codesign for Superjunction Drain Extended MOS Devices by Somayaji, Jhnanesh, Kumar, B. Sampath, Bhat, M. S., Shrivastava, Mayank

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    Analysis of implant parameters in high voltage TRIPLE RESURF LDMOS for advanced SoC applications

    Analysis of implant parameters in high voltage TRIPLE RESURF LDMOS for advanced SoC applications by Somayaji, B. Jhnanesh, Bhat, M. S.

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