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A simple graphic method for evaluating densities and energy levels of impurities in semiconductor from temperature dependence of majority-carrier concentration
by
MATSUURA, H
,
SONOI, K
Published in
Japanese Journal of Applied Physics
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A method for evaluating the densities and energy levels of impurities in semiconductors from the temperature dependence of majority-carrier concentration
by
Matsuura, Hideharu
,
Sonoi, Kazuhide
Published in
Electronics & communications in Japan. Part 2, Electronics
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Electronics & Communications In Japan. Part 2, Electronics
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Japanese Journal Of Applied Physics
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Japanese Journal Of Applied Physics Part 2-Letters
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Japanese Journal Of Applied Physics, Part 2: Letters
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Science & Technology
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Acceptor Density
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Acceptor Level
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Condensed Matter: Electronic Structure, Electrical, Magnetic, And Optical Properties
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Donor Density
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Donor Level
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Electron States
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Engineering
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Engineering, Electrical & Electronic
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Evaluation Of Impurities
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Exact Sciences And Technology
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Graphic Approach
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Graphic Method
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Impurity And Defect Levels
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Impurity Density
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Impurity Evaluation
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Impurity Level
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Physical Sciences
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Physics
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Physics, Applied
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Wiley-Blackwell Journals
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Institute Of Physics Iopscience Extra
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