Search Results - Sopinskyy, Mykola V.

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  1. 1
    Excitation of Surface Plasmon Polaritons on Aluminum-Coated Diffraction Gratings Formed on an Inorganic Chalcogenide Photoresist: Influence of Profile Shape

    Excitation of Surface Plasmon Polaritons on Aluminum-Coated Diffraction Gratings Formed on an Inorganic Chalcogenide Photoresist: Influence of Profile Shape by Indutnyi, Ivan Z., Mynko, Viktor I., Sopinskyy, Mykola V., Lytvyn, Petro M., Dan’ko, Viktor A.

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  2. 2
    Samarium-induced enhancement of SiOx decomposition and Si nanocrystals formation

    Samarium-induced enhancement of SiOx decomposition and Si nanocrystals formation by Michailovska, Katerina V., Indutnyi, Ivan Z., Shepeliavyi, Petro E., Sopinskyy, Mykola V., Dan’ko, Viktor A., Tsybrii, Zinoviia F., Nikolenko, Andrii S.

    Published in Applied nanoscience
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  3. 3
    Formation of silicon nanocomposites by annealing of (SiOx/Sm)n multilayers: luminescence, Raman and FTIR studies

    Formation of silicon nanocomposites by annealing of (SiOx/Sm)n multilayers: luminescence, Raman and FTIR studies by Michailovska, Katerina V., Indutnyi, Ivan Z., Shepeliavyi, Petro E., Sopinskyy, Mykola V., Dan’ko, Viktor A., Tsybrii, Zinoviia F., Maziar, Denys M.

    Published in Applied nanoscience
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  4. 4
    Possibility of graphene growth by close space sublimation

    Possibility of graphene growth by close space sublimation by Sopinskyy, Mykola V, Khomchenko, Viktoriya S, Strelchuk, Viktor V, Nikolenko, Andrii S, Olchovyk, Genadiy P, Vishnyak, Volodymyr V, Stonis, Viktor V

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  5. 5
    Formation of Nanocomposites by Oxidizing Annealing of SiOx and SiOx<Er,F> Films: Ellipsometry and FTIR Analysis

    Formation of Nanocomposites by Oxidizing Annealing of SiOx and SiOx<Er,F> Films: Ellipsometry and FTIR Analysis by Sopinskyy, Mykola V, Vlasenko, Natalya A, Lisovskyy, Igor P, Zlobin, Sergii O, Tsybrii, Zinoviia F, Veligura, Lyudmyla I

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  6. 6
    Formation of Nanocomposites by Oxidizing Annealing of SiO^sub x^ and SiO^sub x^ Films: Ellipsometry and FTIR Analysis

    Formation of Nanocomposites by Oxidizing Annealing of SiO^sub x^ and SiO^sub x^ Films: Ellipsometry and FTIR Analysis by Sopinskyy, Mykola V, Vlasenko, Natalya A, Lisovskyy, Igor P, Zlobin, Sergii O, Tsybrii, Zinoviia F, Veligura, Lyudmyla I

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  7. 7
    Formation of Nanocomposites by Oxidizing Annealing of SiO x and SiO x <Er,F> Films: Ellipsometry and FTIR Analysis

    Formation of Nanocomposites by Oxidizing Annealing of SiO x and SiO x <Er,F> Films: Ellipsometry and FTIR Analysis by Sopinskyy, Mykola V, Vlasenko, Natalya A, Lisovskyy, Igor P, Zlobin, Sergii O, Tsybrii, Zinoviia F, Veligura, Lyudmyla I

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