Search Results - Sosphenov, A. N.

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  1. 1
    X-ray standing waves in LSM for characterization of ultra-thin films

    X-ray standing waves in LSM for characterization of ultra-thin films by Zheludeva, S I, Kovalchuk, M V, Novikova, N N, Sosphenov, A N

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  2. 2
    New modification of X-ray standing waves above the surface of layered substrates under total external reflection conditions for structural characterization of organic layers

    New modification of X-ray standing waves above the surface of layered substrates under total external reflection conditions for structural characterization of organic layers by Zheludeva, S.I., Kovalchuk, M.V., Novikova, N.N., Sosphenov, A.N., Malysheva, N.E., Salashchenko, N.N., Akhsakhalyan, A.D., Platonov, Yu.Ya

    Published in Thin solid films
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  3. 3
    X-ray total external reflection fluorescence study of LB films on solid substrate

    X-ray total external reflection fluorescence study of LB films on solid substrate by Zheludeva, S I, Kovalchuk, M V, Novikova, N N, Sosphenov, A N, Erochin, V E, Feigin, L A

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  4. 4
    New method of ultra-thin film characterization applied to the investigation of C/Ni/C structures under heat load

    New method of ultra-thin film characterization applied to the investigation of C/Ni/C structures under heat load by Zheludeva, S.I., Kovalchuk, M.V., Novikova, N.N., Sosphenov, A.N., Malysheva, N.E., Salashenko, N.N., Akhsakhalyan, A.D., Platonov, Yu.Yu, Cernik, R.I., Collins, S.P.

    Published in Thin solid films
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  5. 5
    Investigation of heat treatment effects on Ni/C bilayer parameters by XRSW

    Investigation of heat treatment effects on Ni/C bilayer parameters by XRSW by Zheludeva, S.I., Kovalchuk, M.V., Novikova, N.N., Sosphenov, A.N., Malysheva, N.E., Salashenko, N.N., Akhsakhalyan, A.D., Platonov, Yu.Yu

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  6. 6
    Site preferences in Bi: YIG film determined by the x-ray standing wave method

    Site preferences in Bi: YIG film determined by the x-ray standing wave method by Novák, P., Kub, J., Maryško, M., Kazimirov, A.Yu, Sosphenov, A.N., Kovalchuk, M.V.

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  7. 7
    X-ray Standing Waves in X-ray Specular Reflection and Fluorescence Study of Nano-Films

    X-ray Standing Waves in X-ray Specular Reflection and Fluorescence Study of Nano-Films by Zheludeva, S. I., Kovalchuk, M. V., Novikova, N. N., Sosphenov, A. N., Salaschenko, N. N., Shamov, E. A., Prokhorov, K. A., Burattini, E., Cappuccio, G.

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  8. 8
    Investigation of heat treatment effects on Ni/C bilayer parameters by XRSW

    Investigation of heat treatment effects on Ni/C bilayer parameters by XRSW by Zheludeva, S I, Kovalchuk, M V, Novikova, N N, Sosphenov, A N, Malysheva, N E, Salashenko, N N, Akhsakhalyan, A D, Platonov, Y U U

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  9. 9
    X-ray standing waves in LSM for characterization of ultra-thin films

    X-ray standing waves in LSM for characterization of ultra-thin films by ZHELUDEVA, S. I, KOVALCHUK, M.V, NOVIKOVA, N. N, SOSPHENOV, A. N

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  10. 10
    X-ray total external reflection fluorescence study of LB films on solid substrate

    X-ray total external reflection fluorescence study of LB films on solid substrate by ZHELUDEVA, S. I, KOVALCHUK, M. V, NOVIKOVA, N. N, SOSPHENOV, A. N, EROCHIN, V. E, FEIGIN, L. A

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  11. 11
    New method of ultra-thin film characterization applied to the investigation of C/Ni/C structures under heat load

    New method of ultra-thin film characterization applied to the investigation of C/Ni/C structures under heat load by ZHELUDEVA, S. I, KOVALCHUK, M. V, NOVIKOVA, N. N, SOSPHENOV, A. N, MALYSHEVA, N. E, SALASHENKO, N. N, AKHSAKHALYAN, A. D, PLATONOV, YU. YU, CERNIK, R. I, COLLINS, S. P

    Published in Thin solid films
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