Search Results - Sowariraj, M.S.B.

  • Showing 1 - 4 results of 4
Refine Results
  1. 1
    Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels –An explanation and die protection strategy

    Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels –An explanation and die protection strategy by Sowariraj, M.S.B., Smedes, Theo, Salm, Cora, Mouthaan, Ton, Kuper, Fred G

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    A 3-D Circuit Model to evaluate CDM performance of ICs

    A 3-D Circuit Model to evaluate CDM performance of ICs by Sowariraj, M.S.B., Smedes, Theo, de Jong, Peter C., Salm, Cora, Mouthaan, Ton, Kuper, Fred G

    Get full text
    Items that this one cites
    Article
    Save to List
    Saved in:
  3. 3
    The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress

    The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress by Sowariraj, M.S.B., Salm, Cora, Mouthaan, Ton, G Kuper, Fred, Smedes, Theo

    Get full text
    Article
    Save to List
    Saved in:
  4. 4
    Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress

    Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress by Sowariraj, M.S.B., de Jong, P.C., Cora, S.M., Smedes, T., Mouthaan, A.J.T., Kuper, F.G.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: