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Search Results - Srinivas, P.S.T.N.
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Logic-in-memory application of silicon nanotube-based FBFET with core-source architecture
by
Katta, Sai Shirov
,
Kumari, Tripty
,
Srinivas, P.S.T.N
,
Tiwari, Pramod Kumar
Published in
Microelectronics
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A machine learning approach to accelerate reliability prediction in nanowire FETs from self-heating perspective
by
Kumar, T. Sandeep
,
Hazarika, Anusha
,
Srinivas, P.S.T.N.
,
Tiwari, Pramod Kumar
,
Kumar, Arun
Published in
Microelectronics and reliability
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Impact of self-heating on thermal noise in In1−xGaxAs GAA MOSFETs
by
Srinivas, P.S.T.N.
,
Jit, Satyabrata
,
Tiwari, Pramod Kumar
Published in
Microelectronics
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Microelectronics
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Microelectronics Journal
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Microelectronics And Reliability
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Engineering
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Engineering, Electrical & Electronic
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Nanoscience & Nanotechnology
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Science & Technology
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Science & Technology - Other Topics
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Technology
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Feedback Fet
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Logic-In-Memory
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Machine Learning
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Multivalued Logic
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Nanowire Fets
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Physical Sciences
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Retention Time
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Silicon Nanotube
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Sciencedirect Freedom Collection
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Backfile Package - Engineering And Technology [Yen]
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Backfile Package - Materials Science [Yms]
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