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High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast
by
Boureau, Victor
,
Sta o, Michal
,
Rouvière, Jean-Luc
,
Toussaint, Jean-Christophe
,
Fruchart, Olivier
,
Cooper, David
Published in
Journal of physics. D, Applied physics
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Journal Of Physics. D, Applied Physics
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4D-Stem
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Condensed Matter
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Electric Field
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Electron Holography
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Lorentz Microscopy
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Magnetic Induction
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Materials Science
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Physical Sciences
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Physics
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Physics, Applied
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Pixelated Dpc
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Pixelated Stem
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Science & Technology
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Institute Of Physics:jisc Collections:iop Publishing Journal Archive 1874-1998 (Access Period 2020 To 2024)
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