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Nested Sampling aided determination of tantalum optical constants in the EUV spectral range
by
Saadeh, Qais
,
Naujok, Philipp
,
Wu, Meiyi
,
Philipsen, Vicky
,
Thakare, Devesh
,
Scholze, Frank
,
Buchholz, Christian
,
Stadelhoff, Christian
,
Wiesner, Thomas
,
Soltwisch, Victor
Published in
Applied optics (2004)
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Corrigendum: Experimental determination of differential scattering coefficients for nickel by means of linearly polarized x-ray radiation (2023 Metrologia 60 035001)
by
Wählisch, André
,
Wansleben, Malte
,
Weser, Jan
,
Stadelhoff, Christian
,
Holfelder, Ina
,
Kayser, Yves
,
Beckhoff, Burkhard
Published in
Metrologia
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Experimental determination of differential scattering coefficients for nickel by means of linearly polarized x-ray radiation
by
Wählisch, André
,
Wansleben, Malte
,
Weser, Jan
,
Stadelhoff, Christian
,
Holfelder, Ina
,
Kayser, Yves
,
Beckhoff, Burkhard
Published in
Metrologia
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Time-frequency analysis assisted determination of ruthenium optical constants in the sub-EUV spectral range 8 nm – 23.75 nm
by
Saadeh, Qais
,
Naujok, Philipp
,
Philipsen, Vicky
,
Hönicke, Philipp
,
Laubis, Christian
,
Buchholz, Christian
,
Andrle, Anna
,
Stadelhoff, Christian
,
Mentzel, Heiko
,
Schönstedt, Anja
,
Soltwisch, Victor
,
Scholze, Frank
Published in
Optics express
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Time-frequency analysis assisted reconstruction of ruthenium optical constants in the sub-EUV spectral range 8nm-23.75nm
by
Saadeh, Qais
,
Naujok, Philipp
,
Philipsen, Vicky
,
Hönicke, Philipp
,
Laubis, Christian
,
Buchholz, Christian
,
Andrle, Anna
,
Stadelhoff, Christian
,
Mentzel, Heiko
,
Schönstedt, Anja
,
Soltwisch, Victor
,
Scholze, Frank
Published in
arXiv.org
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