Search Results - Stojadinovic, N.D.

  • Showing 1 - 4 results of 4
Refine Results
  1. 1
    Charge-pumping characterization of SiO/sub 2//Si interface in virgin and irradiated power VDMOSFETs

    Charge-pumping characterization of SiO/sub 2//Si interface in virgin and irradiated power VDMOSFETs by Habas, P., Prijic, Z., Pantic, D., Stojadinovic, N.D.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Editorial

    Editorial by Stojadinović, N.D.

    Get full text
    Article
    Save to List
    Saved in:
  3. 3
    Computer as Powerful Tool in Reliability Testing of Thin Gate Dielectrics in MOS Devices

    Computer as Powerful Tool in Reliability Testing of Thin Gate Dielectrics in MOS Devices by Vracar, L.M., Pesic, B.M., Stojadinovic, N.D.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  4. 4
    Polycrystalline silicon thin-film resistors with irreversible resistance transition

    Polycrystalline silicon thin-film resistors with irreversible resistance transition by Petkovic, D M, Stojadinovic, N D

    Published in Microelectronics
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: