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Search Results - Stojadinovic, Ninoslav D.
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On the Recoverable and Permanent Components of NBTI in p-Channel Power VDMOSFETs
by
Dankovic, Danijel
,
Manic, Ivica
,
Davidovic, Vojkan
,
Prijic, Aneta
,
Marjanovic, Milos
,
Ilic, Aleksandar
,
Prijic, Zoran
,
Stojadinovic, Ninoslav D.
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IEEE transactions on device and materials reliability
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Modeling of NBTS Effects in P-Channel Power VDMOSFETs
by
Dankovic, Danijel
,
Mitrovic, Nikola
,
Prijic, Zoran
,
Stojadinovic, Ninoslav D.
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IEEE transactions on device and materials reliability
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In memory of D. Stewart Peck
by
Stojadinovic, Ninoslav D
,
Pecht, Michael G
Published in
Microelectronics and reliability
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Quarter century of field of microelectronics and “microelectronics journal”: Joint crossroads for further progress and development
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Stojadinovic, Ninoslav D.
Published in
Microelectronics
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Guest editorial
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Stojadinović, Ninoslav D.
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Microelectronics
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Guest editorial
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Stojadinović, Ninoslav D.
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Microelectronics
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Computer as Powerful Tool in Reliability Testing of Thin Gate Dielectrics in MOS Devices
by
Vracar, L.M.
,
Pesic, B.M.
,
Stojadinovic, N.D.
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A new technology computer-aided design (TCAD) system based on neural network models
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Pantic, Dragan
,
Trajkovic, Tatjana
,
Stojadinovic, Ninoslav
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Microelectronics
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