Search Results - Stoker, Matt W.

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    Observation of semiconductor device channel strain using in-line high resolution X-ray diffraction

    Observation of semiconductor device channel strain using in-line high resolution X-ray diffraction by Holt, Judson R., Madan, Anita, Harley, Eric C. T., Stoker, Matt W., Pinto, Teresa, Schepis, Dominic J., Adam, Thomas N., Murray, Conal E., Bedell, Stephen W., Holt, Martin

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    Automated integration of lidar into the LANDFIRE product suite

    Automated integration of lidar into the LANDFIRE product suite by Peterson, Birgit, Nelson, Kurtis J, Seielstad, Carl, Stoker, Jason, Jolly, W. Matt, Parsons, Russell

    Published in Remote sensing letters
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