Muonium in synthetic diamond by Mamedov, T.N., Baturin, A.S., Blank, V.D., Gritsaj, K.I., Kuznetsov, M.S., Nosukhin, S.A., Ralchenko, V.G., Scheuermann, R., Stoykov, A.V., Terentiev, S.A.

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Shallow acceptor impurities in diamond-like semiconductors studied by polarized negative muons by Mamedov, T.N., Gorelkin, V.N., Gritsaj, K.I., Herlach, D., Stoykov, A.V., Zimmermann, U.

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Non-equilibrium charge carrier dynamics in synthetic diamond studied by the μSR-method by Mamedov, T.N., Baturin, A.S., Blank, V.D., Herlach, D., Gorelkin, V.N., Gritsaj, K.I., Kuznetsov, M.S., Nosukhin, S.A., Ralchenko, V.G., Stoykov, A.V., Terentiev, S.A., Zhukov, V.A., Zimmermann, U.

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Behavior of shallow acceptor impurities in uniaxially stressed silicon and in synthetic diamond studied by μ - SR by Mamedov, T.N., Andreika, D., Baturin, A.S., Herlach, D., Gorelkin, V.N., Gritsaj, K.I., Ralchenko, V.G., Stoykov, A.V., Zhukov, V.A., Zimmermann, U.

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Behavior of shallow acceptor impurities in uniaxially stressed silicon and in synthetic diamond studied by by Mamedov, T.N., Andreika, D., Baturin, A.S., Herlach, D., Gorelkin, V.N., Gritsaj, K.I., Ralchenko, V.G., Stoykov, A.V., Zhukov, V.A., Zimmermann, U.

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μ −SR investigations in silicon by Mamedov, T.N., Gritsaj, K.I., Stoykov, A.V., Andrianov, D.G., Gorelkin, V.N., Herlach, D., Zimmermann, U., Kormann, O., Major, J., Schefzik, M.

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μSR-spectrometer on the surface muon beam of the JINR phasotron by Mamedov, T.N, Duginov, V.N, Grebinnik, V.G, Gritsaj, K.I, Gustov, S.A, Mirokhin, I.V, Olshevsky, V.G, Stoykov, A.V, Zhukov, V.A

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Plasticity Detection and Quantification in Monopile Support Structures Due to Axial Impact Loading by Meijers, P.C., Tsouvalas, A., Metrikine, A.V.

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