Search Results - Strayer, Roy E.

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  1. 1
    Neutron Induced Single Event Upset (SEU) Testing of Commercial Memory Devices with Embedded Error Correction Codes (ECC)

    Neutron Induced Single Event Upset (SEU) Testing of Commercial Memory Devices with Embedded Error Correction Codes (ECC) by Bird, John M., Peters, Michael K., Fullem, Travis Z., Tostanoski, Michael J., Deaton, Terrence F., Hartojo, Kristianto, Strayer, Roy E.

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  2. 2
    Neutron Induced Single Event Upset (SEU) Testing of Static Random Access Memory (SRAM) Devices

    Neutron Induced Single Event Upset (SEU) Testing of Static Random Access Memory (SRAM) Devices by Tostanoski, Michael J., Deaton, Terrence F., Strayer, Roy E., Goldflam, Rudolf, Fullem, Travis Z.

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    User's Manual for Electromagnetic Pulse Coupling Code TEMPO

    User's Manual for Electromagnetic Pulse Coupling Code TEMPO by Stark,Werner J, Clark,David A, Strayer,Roy E , Jr

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    Memoirs of Fellows and Corresponding Fellows of the Mediaeval Academy

    Memoirs of Fellows and Corresponding Fellows of the Mediaeval Academy by Clark, Charles Upson, Cross, Tom Peete, Deferrari, Roy Joseph, McKeon, Richard Peter, Nitze, William Albert, Gras, N. S. B., Lunt, William E., Strayer, J. R., Laistner, M. L. W., Lowe, E. A., Ullman, B. L., Gerould, G. H., Robinson, F. N., Root, R. K., Gilson, Étienne, Phelan, Gerald B., Wolfson, H. A.

    Published in Speculum
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