Search Results - Streater, R.W.

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  1. 1
    SIMS measurements of oxygen impurities in AlGaInP semiconductor material and laser diodes

    SIMS measurements of oxygen impurities in AlGaInP semiconductor material and laser diodes by Najda, S.P., Kean, A., Streater, R.W., SpringThorpe, A.J.

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  2. 2
    The optimization of metal-Insulator-Metal nonlinear devices for use in multiplexed liquid crystal displays

    The optimization of metal-Insulator-Metal nonlinear devices for use in multiplexed liquid crystal displays by Baraff, D.R., Long, J.R., MacLaurin, B.K., Miner, C.J., Streater, R.W.

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  3. 3
    Determination of Al Ga(1 − )As composition: the MBE perspective

    Determination of Al Ga(1 − )As composition: the MBE perspective by Wasilewski, Z.R., Dion, M.M., Lockwood, D.J., Poole, P., Streater, R.W., SpringThorpe, A.J.

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  4. 4
    Device quality AlGaAs grown by chemical beam epitaxy

    Device quality AlGaAs grown by chemical beam epitaxy by Moore, W.T., Mandeville, P., Streater, R.W., Miner, C.J.

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  5. 5
    Setting limits on the accuracy of X-ray determination of Al concentration in [formula omitted] epitaxial layers

    Setting limits on the accuracy of X-ray determination of Al concentration in [formula omitted] epitaxial layers by Bassignana, I.C., Macquistan, D.A., Streater, R.W., Hillier, G.C., Packwood, R., Moore, V.

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  6. 6
    Iodine-assisted molecular beam epitaxy

    Iodine-assisted molecular beam epitaxy by Micovic, M., Lubyshev, D., Cai, W.Z., Flack, F., Streater, R.W., SpringThorpe, A.J., Miller, D.L.

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  7. 7
    Determination of AlxGa(1 − x)As composition: the MBE perspective

    Determination of AlxGa(1 − x)As composition: the MBE perspective by Wasilewski, Z.R., Dion, M.M., Lockwood, D.J., Poole, P., Streater, R.W., SpringThorpe, A.J.

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  8. 8
    Characterization of He-plasma-assisted GSMBE InGaAsP

    Characterization of He-plasma-assisted GSMBE InGaAsP by Pinkney, H., Thompson, D.A., Robinson, B.J., Simpson, P.J., Myler, U., Streater, R.W.

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  9. 9
    Re-growth over grating-etched InGaAsP

    Re-growth over grating-etched InGaAsP by Robinson, B.J., Bursik, J., Thompson, D.A., Weatherly, G.C., Streater, R.W.

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  10. 10
    Low energy electron diffraction intensities from the (311) surface of copper

    Low energy electron diffraction intensities from the (311) surface of copper by Moore, W.T., Streater, R.W., Frost, D.C., Mitchell, K.A.R.

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  11. 11
    The structure of the (311) surface of copper as determined by multiple scattering calculations of LEED intensities

    The structure of the (311) surface of copper as determined by multiple scattering calculations of LEED intensities by Streater, R.W., Moore, W.T., Watson, P.R., Frost, D.C., Mitchell, K.A.R.

    Published in Surface science
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