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Search Results - Strus, Mark C
Search Results - Strus, Mark C
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Interfacial energy between carbon nanotubes and polymers measured from nanoscale peel tests in the atomic force microscope
by
Strus, Mark C.
,
Cano, Camilo I.
,
Byron Pipes, R.
,
Nguyen, Cattien V.
,
Raman, Arvind
Published in
Composites science and technology
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Strain energy and lateral friction force distributions of carbon nanotubes manipulated into shapes by atomic force microscopy
by
Strus, Mark C
,
Lahiji, Roya R
,
Ares, Pablo
,
López, Vicente
,
Raman, Arvind
,
Reifenberger, Ron
Published in
Nanotechnology
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Accelerated reliability testing of highly aligned single-walled carbon nanotube networks subjected to DC electrical stressing
by
Strus, Mark C
,
Chiaramonti, Ann N
,
Kim, Young Lae
,
Jung, Yung Joon
,
Keller, Robert R
Published in
Nanotechnology
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Identification of multiple oscillation states of carbon nanotube tipped cantilevers interacting with surfaces in dynamic atomic force microscopy
by
Strus, Mark C.
,
Raman, Arvind
Published in
Physical review. B, Condensed matter and materials physics
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Corrigendum to “Interfacial energy between carbon nanotubes and polymers measured from nanoscale peel tests in the atomic force microscope” [Compos Sci Technol 69 (10) (2009) 1580–...
by
Strus, Mark C.
,
Cano, Camilo I.
,
Byron Pipes, R.
,
Nguyen, Cattien V.
,
Raman, Arvind
Published in
Composites science and technology
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Electrical reliability and breakdown mechanisms in single-walled carbon nanotubes
by
Strus, M. C.
,
Keller, R. R.
,
Barbosa, N.
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Composites Science And Technology
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Physical Review. B
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Physical Review. B, Condensed Matter And Materials Physics
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Materials Science
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Physics
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Physics, Applied
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Nanoscience & Nanotechnology
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Science & Technology - Other Topics
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A. Nanoscale Peeling
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Applied Sciences
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B. Carbon Nanotubes
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C. Polymer Nanocomposites
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Carbon Nanotubes
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Composites
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D. Interfacial Fracture Energy
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Degradation
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E. Atomic Force Microscope
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Electrodes
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Electromigration
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Institute Of Physics
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Science Direct
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Sciencedirect Freedom Collection
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Institute Of Physics Iopscience Extra
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Backfile Package - Engineering And Technology [Yen]
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Backfile Package - Materials Science [Yms]
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Ieee Electronic Library (Iel) Conference Proceedings
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Institute Of Physics:jisc Collections:iop Publishing Journal Archive 1874-1998 (Access Period 2020 To 2024)
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American Physical Society:jisc Collections:aps Read And Publish 2023-2025 (Reading List)
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