Search Results - Suehira, N.

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  1. 1
    Low-temperature noncontact atomic-force microscope with quick sample and cantilever exchange mechanism

    Low-temperature noncontact atomic-force microscope with quick sample and cantilever exchange mechanism by Suehira, N., Tomiyoshi, Y., Sugawara, Y., Morita, S.

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  2. 2
    Observation of Si(1 0 0) surface with noncontact atomic force microscope at 5 K

    Observation of Si(1 0 0) surface with noncontact atomic force microscope at 5 K by Uozumi, T., Tomiyoshi, Y., Suehira, N., Sugawara, Y., Morita, S.

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  3. 3
    Atom manipulation and image artifact on Si(1 1 1)7×7 surface using a low temperature noncontact atomic force microscope

    Atom manipulation and image artifact on Si(1 1 1)7×7 surface using a low temperature noncontact atomic force microscope by Sugawara, Y., Sano, Y., Suehira, N., Morita, S.

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  4. 4
    Development of low temperature ultrahigh vacuum noncontact atomic force microscope with PZT cantilever

    Development of low temperature ultrahigh vacuum noncontact atomic force microscope with PZT cantilever by Suehira, N., Tomiyoshi, Y., Sugiyama, K., Watanabe, S., Fujii, T., Sugawara, Y., Morita, S.

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  5. 5
    Atom manipulation and image artifact on Si(111)7 x 7 surface using a low temperature noncontact atomic force microscope

    Atom manipulation and image artifact on Si(111)7 x 7 surface using a low temperature noncontact atomic force microscope by SUGAWARA, Y, SANO, Y, SUEHIRA, N, MORITA, S

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  6. 6
    Observation of Si(100) surface with noncontact atomic force microscope at 5K

    Observation of Si(100) surface with noncontact atomic force microscope at 5K by Uozumi, T., Tomiyoshi, Y., Suehira, N., Sugawara, Y., Morita, S.

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  7. 7
    Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism

    Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism by Yokoyama, Kousuke, Ochi, Taketoshi, Uchihashi, Takayuki, Ashino, Makoto, Sugawara, Yasuhiro, Suehira, Nobuhito, Morita, Seizo

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  8. 8
    Artifact and Fact of Si(111)7×7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM)

    Artifact and Fact of Si(111)7×7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM) by Nobuhito Suehira, Nobuhito Suehira, Yasuhiro Sugawara, Yasuhiro Sugawara, Seizo Morita, Seizo Morita

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  9. 9
    Investigation of Dual-Focal-Points Optical System with Bright-Field Illumination and Image Processing for UV Nanoimprint Alignment

    Investigation of Dual-Focal-Points Optical System with Bright-Field Illumination and Image Processing for UV Nanoimprint Alignment by Suehira, N., Terasaki, A., Okushima, S., Seki, J., Ono, H.

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