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Search Results - Suehira, Nobuhito
Search Results - Suehira, Nobuhito
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Artifact and Fact of Si(111)7×7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM)
by
Nobuhito Suehira, Nobuhito Suehira
,
Yasuhiro Sugawara, Yasuhiro Sugawara
,
Seizo Morita, Seizo Morita
Published in
Japanese Journal of Applied Physics
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Three-beam spectral-domain optical coherence tomography for retinal imaging
by
Suehira, Nobuhito
,
Ooto, Sotaro
,
Hangai, Masanori
,
Matsumoto, Kazuhiro
,
Tomatsu, Nobuhiro
,
Yuasa, Takashi
,
Yamada, Kazuro
,
Yoshimura, Nagahisa
Published in
Journal of biomedical optics
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Position measurement method for alignment in UV imprint using a high index mold and “electronic” moiré technique
by
Suehira, Nobuhito
,
Terasaki, Atsunori
,
Okushima, Shingo
,
Seki, Junichi
,
Ono, Haruhito
,
Ina, Hideki
Published in
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
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Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism
by
Yokoyama, Kousuke
,
Ochi, Taketoshi
,
Uchihashi, Takayuki
,
Ashino, Makoto
,
Sugawara, Yasuhiro
,
Suehira, Nobuhito
,
Morita, Seizo
Published in
Review of scientific instruments
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Investigation of Dual-Focal-Points Optical System with Bright-Field Illumination and Image Processing for UV Nanoimprint Alignment
by
Suehira, N.
,
Terasaki, A.
,
Okushima, S.
,
Seki, J.
,
Ono, H.
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Position measurement method for alignment in UV imprintusing a high index mold and "electronic" moiré technique
by
Suehira, Nobuhito
,
Terasaki, Atsunori
,
Okushima, Shingo
,
Seki, Junichi
,
Ono, Haruhito
,
Ina, Hideki
Published in
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
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Japanese Journal Of Applied Physics
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