Effect of mechanical strength and residual stress of dielectric capping layer on electromigration performance in Cu/low-k interconnects by Lee, K.-W., Shin, H.J., Wee, Y.J., Kim, T.K., Kim, A.T., Kim, J.H., Choi, S.M., Suh, B.S., Lee, S.J., Park, K.-K., Lee, S.J., Hwang, J.W., Nam, S.W., Moon, Y.J., Ku, J.E., Lee, H.J., Kim, M.Y., Oh, I.H., Maeng, J-.Y., Kim, I.R., Lee, J.E., Choi, W.-H., Park, S.J., Lee, N.I., Kang, H.-K., Suh, G.P.

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INPUT-OUTPUT ANALYSIS AND CARBON FOOTPRINTING: AN OVERVIEW OF APPLICATIONS by Minx, J.C., Wiedmann, T., Wood, R., Peters, G.P., Lenzen, M., Owen, A., Scott, K., Barrett, J., Hubacek, K., Baiocchi, G., Paul, A., Dawkins, E., Briggs, J., Guan, D., Suh, S., Ackerman, F.

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A lazy learning-based QSAR classification study for screening potential histone deacetylase 8 (HDAC8) inhibitors by Cao, G.P., Arooj, M., Thangapandian, S., Park, C., Arulalapperumal, V., Kim, Y., Kwon, Y.J., Kim, H.H., Suh, J.K., Lee, K.W.

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Comparative analyses identify genomic features potentially involved in the evolution of birds-of-paradise by Prost, Stefan, Armstrong, Ellie E, Nylander, Johan, Thomas, Gregg W C, Suh, Alexander, Petersen, Bent, Dalen, Love, Benz, Brett W, Blom, Mozes P K, Palkopoulou, Eleftheria, Ericson, Per G P, Irestedt, Martin

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Effect of the composition on the electrical properties of TaSixNy metal gate electrodes by Suh, You-Seok, Heuss, G.P, Lee, Jae-Hoon, Misra, V

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Effect of the composition on the electrical properties of TaSi/sub x/Ny metal gate electrodes by You-Seok Suh, Heuss, G.P., Jae-Hoon Lee, Misra, V.

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Effect of the composition on the electrical properties of TaSi/sub x/N y metal gate electrodes by You-Seok Suh, Heuss, G.P., Jae-Hoon Lee, Misra, V.

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