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Microwave-cut silicon layer transfer
by
Thompson, D. C.
,
Alford, T. L.
,
Mayer, J. W.
,
Hochbauer, T.
,
Nastasi, M.
,
Lau, S. S.
,
Theodore, N. David
,
Henttinen, K.
,
Suni, llkka
,
Chu, Paul K.
Published in
Applied physics letters
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Applied Physics Letters
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Annealing
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Atomic Force Microscopy
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Ghz Range 01-100
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Hall Effect
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Rutherford Backscattering Spectroscopy
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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