Search Results - Szeloch, R.F.

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  1. 1
    Characterization of fatigued Al lines by means of SThM and XRD: Analysis using fast Fourier transform

    Characterization of fatigued Al lines by means of SThM and XRD: Analysis using fast Fourier transform by Szeloch, R.F., Janus, P., Serafińczuk, J., Szecówka, P.M., Jóźwiak, G.

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  2. 2
    Scanning Thermal Microscopy in Microsystem Reliability Analysis

    Scanning Thermal Microscopy in Microsystem Reliability Analysis by Szeloch, R.F., Gotszalk, T.P., Janus, P.

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  3. 3
    Thick-film Resistor as a Heater

    Thick-film Resistor as a Heater by Koz owski, J, Dziedzic, A, Nitsch, K, Szeloch, R.F

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  4. 4
    Thickfilm Resistor as a Heater

    Thickfilm Resistor as a Heater by Kozowski, J., Dziedzic, A., Nitsch, K., Szeloch, R.F.

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