A 700-V Device in High-Voltage Power ICs With Low On-State Resistance and Enhanced SOA by YANG, Fu-Jen, JENG GONG, SU, Ru-Yi, HUO, Ker-Hsiao, TSAI, Chun-Lin, CHENG, Chih-Chang, LIOU, Ruey-Hsin, TUAN, Hsiao-Chin, HUANG, Chih-Fang

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RESURF p-n Diode With a Buried Layer, a Comprehensive Study by YANG, Fu-Jen, JENG GONG, SU, Ru-Yi, TSAI, Chun-Lin, TUAN, Hsiao-Chin, HUANG, Chih-Fang

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The Effect of Self-Heating in LDMOSFET Expansion Regime by Hsueh-Liang Chou, Ng, J. C. W., Ruey-Hsin Liou, Yu-Chang Jong, Hsiao-Chin Tuan, Chih-Fang Huang, Jeng Gong

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The Study of the Electrothermal Property of High-Voltage Drain-Extended MOSFETs by Chu, Chen-Liang, Hu, Chih-Min, Hung, Chung-Yu, Gong, Jeng, Huang, Chih-Fang, Chen, Fei-Yun, Liou, Ruey-Hsin, Tuan, Hsiao-Chin

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300-V class power n-channel LDMOS transistor implemented in 0.18-μm silicon-on-insulator (SOI) technology by Zhang, Shuai, Tuan, Hsiao-Chin, Wu, Xiao-Jing, Shi, Lei, Wu, Jian

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New Circuit Topology for System-Level Reliability of GaN by Lin, Ming-Cheng, Chang, Wen-Che, Wu, Haw-Yun, Lansbergen, Gabriel Petrus, Kwan, Man-Ho, Yu, Jiun-Lei, Wu, Cheng-Pao, Tsai, Chun-Lin, Tuan, Hsiao-Chin, Kalnitsky, Alex

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Bulk-Si with poly bump process scheme for MEMS sensors by Chun-Wen Cheng, Kai-Chih Liang, Chia-Hua Chu, Te-Hao Lee, Jiou-Kang Lee, Chung-Hsien Lin, Hsiao Chin Tuan, Kalnitsky, A., Weileun Fang, Horsley, D. A.

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Enhanced Biosensing Resolution with Foundry Fabricated Individually Addressable Dual-Gated ISFETs by Duarte-Guevara, Carlos, Lai, Fei-Lung, Cheng, Chun-Wen, Reddy, Bobby, Salm, Eric, Swaminathan, Vikhram, Tsui, Ying-Kit, Tuan, Hsiao Chin, Kalnitsky, Alex, Liu, Yi-Shao, Bashir, Rashid

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Optimization of Dual-ESL Stressor Geometry Effects for High Performance 65nm SOI Transistors by Xiang-Zheng Bo, Grudowski, P., Adams, V., Loiko, K., Tekleab, D., Filipiak, S., Hackenberg, J., Kolagunta, V., Foisy, M., Li-Te Lin, Fung, K.H., Chi-Hsi Wu, Hsiao-Chin Tuan, Cheek, J.

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Semiconductor specialty technologies in IOT era by Hsiao-Chin Tuan

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MEMS technology development and manufacturing in a CMOS foundry by Liu, C.M., Lin, Chung-Hsien, Chung, Tien-Kan, Chang, Kuei-Sung, Liu, Yi-Shao, Chou, Bruce C.S., Tsai, Robert Chin-Fu, Shen, Nick Y.M., Chen, Benior S.F., Cheng, Emerson C.W., Tuan, Hsiao Chin, Kalnitsky, Alex, Cheng, Sean

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A consistency approach to evaluation of bridging studies and multi-regional trials by Tsou, Hsiao-Hui, Chien, Tuan-Ying, Liu, Jen-pei, Hsiao, Chin-Fu

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