Search Results - Tabakman, Keith

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    Reducing Environmentally Induced Defects While Maintaining Productivity

    Reducing Environmentally Induced Defects While Maintaining Productivity by van Roijen, R., Conti, S. G., Keyser, R., Arndt, R., Burda, R., Ayala, J., Henry, R. O., Levy, J., Maxson, J., Meyette, E., Steer, W., Tabakman, K., Chienfan Yu

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    SiGe Selective Epitaxy: Morphology and Thickness Control for High Performance CMOS Technology

    SiGe Selective Epitaxy: Morphology and Thickness Control for High Performance CMOS Technology by Holt, Judson R., Harley, Eric C., Adam, Thomas N., Jeng, Shwu-Jen, Tabakman, Keith, Pal, Rohit, Nayfeh, Hasan M., Black, Linda R., Kempisty, Jeremy J., Stoker, Matthew W., Dube, Abhishek, Schepis, Dominic J.

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    Semiconductor Process and Device Modeling: a graduate course/undergraduate elective in microelectronic engineering at RIT

    Semiconductor Process and Device Modeling: a graduate course/undergraduate elective in microelectronic engineering at RIT by Hirschman, K.D., Hebding, J., Saxer, R., Tabakman, K.

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