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A post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit for high-density DRAMs
by
Wee, Jae-Kyung
,
Min, Kyeong-Sik
,
Park, Jong-Tai
,
Lee, Sang-Pil
,
Kim, Young-Hee
,
Yang, Tae-Heum
,
Joo, Jong-Doo
,
Chung, Jin-Yong
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IEEE journal of solid-state circuits
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A post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit for high-density DRAMs
by
Kyeong-Sik Min
,
Jong-Tai Park
,
Sang-Pil Lee
,
Young-Hee Kim
,
Tae-Heum Yang
,
Jong-Doo Joo
,
Kyung-Mi Lee
,
Jae-Kyung Wee
,
Jin-Yong Chung
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Conference Proceeding
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Ieee Journal Of Solid-State Circuits
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Subjects
Breakdown Voltage
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Charge Pumps
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Circuits
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Engineering
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Engineering, Electrical & Electronic
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Latches
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Mos Capacitors
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Random Access Memory
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Redundancy
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Robustness
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Science & Technology
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Technology
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Aging
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Antifuse
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Antifuses
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Bipolar Programming Voltage Scheme
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Bit-Repair Scheme
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Breakdown
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Insulation
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