Search Results - Tahiat, Abderrahim

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  1. 1
    Refined Analysis of the Correlated Carrier Number and Mobility Fluctuations Mechanism in MOSFETs

    Refined Analysis of the Correlated Carrier Number and Mobility Fluctuations Mechanism in MOSFETs by Cretu, Bogdan, Tahiat, Abderrahim, Veloso, Anabela, Simoen, Eddy

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  2. 2
    (Invited) In-Depth Understanding of the Key Contributors to the Total Flicker Noise in Advanced Logic Devices

    (Invited) In-Depth Understanding of the Key Contributors to the Total Flicker Noise in Advanced Logic Devices by Cretu, Bogdan, Tahiat, Abderrahim, Veloso, Anabela, Simoen, Eddy

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  3. 3
    (Invited) In-Depth DC and Low Frequency Noise Characterization of Nanosheet FETs at Room and Cryogenic Temperatures

    (Invited) In-Depth DC and Low Frequency Noise Characterization of Nanosheet FETs at Room and Cryogenic Temperatures by Cretu, Bogdan, Tahiat, Abderrahim, Veloso, Anabela, Simoen, Eddy

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  4. 4
    Discussion on the Main Mechanisms Contributing to the 1/f Noise in GAA Si VNW pMOSFETs

    Discussion on the Main Mechanisms Contributing to the 1/f Noise in GAA Si VNW pMOSFETs by Tahiat, Abderrahim, Cretu, Bogdan, Veloso, Anabela, Simoen, Eddy

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  5. 5
    Trap Identification in Gate-All-Around Vertically Stacked Si n-channel Nanosheet FETs

    Trap Identification in Gate-All-Around Vertically Stacked Si n-channel Nanosheet FETs by Tahiat, Abderrahim, Cretu, Bogdan, Veloso, Anabela, Simoen, Eddy

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