Search Results - Tallian, Miklos

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    Comparison of Silicon Surface Preparation Methods for Measurement of Minority Carrier Lifetime using the Microwave Photo-conductive Decay (μ-PCD) coupled with Continuous Corona Charge (Charge-PCD)

    Comparison of Silicon Surface Preparation Methods for Measurement of Minority Carrier Lifetime using the Microwave Photo-conductive Decay (μ-PCD) coupled with Continuous Corona Cha... by Pavelka, Tibor, Pap, Aron, Kenesei, Peter, Varga, Mariann, Novinics, F., Tallian, Miklos, Borionetti, Gabriella, Guaglio, Gianluca, Pfeffer, Markus, Don, Eric R.

    Published in ECS transactions
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    Correlation Study of Bulk Si Stress and Lithography Defects Using Polarized Stress Imager

    Correlation Study of Bulk Si Stress and Lithography Defects Using Polarized Stress Imager by Janecska, Mate, Kovacs, Zsolt, Pongracz, Anita, Tallian, Miklos

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