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Microstructure, joint strength and failure mechanisms of SnPb and Pb-free solders in BGA packages
by
Ming Li
,
Lee, K.Y.
,
Olsen, D.R.
,
Chen, W.T.
,
Tan, B.T.C.
,
Mhaisalkar, S.
Published in
IEEE transactions on electronics packaging manufacturing
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Microstructure, joint strength and failure mechanism of Sn-Ag, Sn-Ag-Cu versus Sn-Pb-Ag solders in BGA packages
by
Ka Yau Lee
,
Ming Li
,
Olsen, D.R.
,
Chen, W.T.
,
Tan, B.T.C.
,
Mhaisalkar, S.
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Ieee Transactions On Electronics Packaging Manufacturing
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Aging
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Engineering
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Engineering, Manufacturing
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Failure Analysis
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Gold
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Intermetallic
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Lead
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Microstructure
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Science & Technology
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Technology
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Temperature
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Tin
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Activation Energy
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Applied Sciences
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Ball Shear Strength
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Design. Technologies. Operation Analysis. Testing
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Electronic Equipment And Fabrication. Passive Components, Printed Wiring Boards, Connectics
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Electronics
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Engineering, Electrical & Electronic
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Environmentally Friendly Manufacturing Techniques
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