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Search Results - Tanrıkulu, E. Erbilen
Search Results - Tanrıkulu, E. Erbilen
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Variation of the Surface States and Series Resistance Depending on Voltage, and Their Effects on the Electrical Features of a Schottky Structure with CdZnO Interface
by
Erbilen Tanrıkulu, E.
,
Taşçıoğlu, İ.
Published in
Journal of electronic materials
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Correction: Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductanc...
by
Güçlü, Ç. Ş.
,
Tanrıkulu, E. Erbilen
,
Ulusoy, M.
,
Azizian-Kalandaragh, Yashar
,
Altındal, Ş.
Published in
Journal of materials science. Materials in electronics
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A comparison of electrical characteristics of the Au/n-Si Schottky diodes with (ZnCdS:GO(1:1) and (ZnCdS:GO(1:0.5) doped PVP interlayer using current–voltage (I–V) and impedance–vo...
by
Güçlü, Ç. Ş.
,
Tanrıkulu, E. Erbilen
,
Dere, A.
,
Altındal, Ş.
,
Azizian-Kalandaragh, Y.
Published in
Journal of materials science. Materials in electronics
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Frequency-dependent physical parameters, the voltage-dependent profile of surface traps, and their lifetime of Au/(ZnCdS-GO:PVP)/n-Si structures by using the conductance method
by
Güçlü, Ç. Ş.
,
Tanrıkulu, E. Erbilen
,
Ulusoy, M.
,
Kalandargh, Y. Azizian
,
Altındal, Ş.
Published in
Journal of materials science. Materials in electronics
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Evaluation of the current transport mechanism depending on the temperature of Schottky structures with Ti:DLC interlayer
by
Erbilen Tanrıkulu, E.
,
Berkün, Ö.
,
Ulusoy, M.
,
Avar, B.
,
Durmuş, H.
,
Altındal, Ş.
Published in
Materials today communications
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