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Stacked BGA design, development, and materials selection considerations for improved testing and stacking, reduced warpage and environmental stress, and enhanced thermal qualities
by
Tan Yong Kian
,
Tay Wuu Yean
,
Lee Kian Chai
,
Ng Hong Wan
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Conference Proceeding
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Conference Proceedings
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Assembly
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Circuit Testing
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Costs
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Decoding
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Electronics Packaging
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Engineering
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Engineering, Electrical & Electronic
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Materials Testing
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Semiconductor Device Packaging
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Semiconductor Device Testing
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Stacking
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Technology
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Thermal Stresses
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Ieee Electronic Library (Iel) Conference Proceedings
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