Search Results - Tejnil, E

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  1. 1
    Phase-shifting point diffraction interferometer

    Phase-shifting point diffraction interferometer by Medecki, H, Tejnil, E, Goldberg, K A, Bokor, J

    Published in Optics letters
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  2. 2
    Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions

    Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions by Attwood, D.T., Naulleau, P., Goldberg, K.A., Tejnil, E., Chang Chang, Beguiristain, R., Batson, P., Bokor, J., Gullikson, E.M., Koike, M., Medecki, H., Underwood, J.H.

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  3. 3
    Phase effects owing to multilayer coatings in a two-mirror extreme-ultraviolet schwarzschild objective

    Phase effects owing to multilayer coatings in a two-mirror extreme-ultraviolet schwarzschild objective by Tejnil, E, Goldberg, K A, Bokor, J

    Published in Applied optics (2004)
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  4. 4
    A Phase-Shifting Point Diffraction Interferometer

    A Phase-Shifting Point Diffraction Interferometer by Medecki, H., Tejnil, E., Goldberg, K.A., Bokor, J.

    Published in Optics letters
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  5. 5
    Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions : Extreme Ultraviolet Lithography

    Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions : Extreme Ultraviolet Lithography by ATTWOOD, D. T, NAULLEAU, P, MEDECKI, H, UNDERWOOD, J. H, GOLDBERG, K. A, TEJNIL, E, CHANG CHANG, BEGUIRISTAIN, R, BATSON, P, BOKOR, J, GULLIKSON, E. M, KOIKE, M

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  6. 6
    Tunable Coherent Radiation in the Soft X-ray and Extreme Ultraviolet spectral regions

    Tunable Coherent Radiation in the Soft X-ray and Extreme Ultraviolet spectral regions by Attwood, D.T., Batson, P., Beguiristain, R., Bokor, J., Chang, C., Goldberg, K.A., Gullikson, Eric M., Koike, Masato, Medecki, H., Naulleau, P., Tejnil, E., Underwood, J.H.

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  7. 7
    Interferometry using undulator sources (invited, abstract)

    Interferometry using undulator sources (invited, abstract) by Beguiristain, R., Goldberg, K. A., Tejnil, E., Bokor, J., Medecki, H., Attwood, D. T., Jackson, K.

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  8. 8
    Actinic detection of sub-100 nm defects on extreme ultraviolet lithography mask blanks

    Actinic detection of sub-100 nm defects on extreme ultraviolet lithography mask blanks by Jeong, Seongtae, Johnson, Lewis, Rekawa, Seno, Walton, Chris C., Prisbrey, Shon T., Tejnil, Edita, Underwood, James H., Bokor, Jeffrey

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  9. 9
    Properties Of Visible Light Emitting (Al/sub y/Ga(/sub 1-y))/sub 0.5/In/sub 0.5/P Multiple Quantum Well Lasers With Varying Quantum Well Al Compositions

    Properties Of Visible Light Emitting (Al/sub y/Ga(/sub 1-y))/sub 0.5/In/sub 0.5/P Multiple Quantum Well Lasers With Varying Quantum Well Al Compositions by Thornton, R.L., Tejnil, E., Mosby, W.J., Bour, D.

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