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Process Window Centering for 22 nm Lithography
by
Buengener, Ralf
,
Boye, Carol
,
Rhoads, Bryan N
,
Chong, Sang Y
,
Tejwani, Charu
,
Burns, Sean D
,
Stamper, Andrew D
,
Nafisi, Kourosh
,
Brodsky, Colin J
,
Fan, Susan S
,
Kini, Sumanth
,
Hahn, Roland
Published in
IEEE transactions on semiconductor manufacturing
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Process Window Centering for 22 nm lithography
by
Buengener, Ralf
,
Boye, C
,
Rhoads, B N
,
Chong, S Y
,
Tejwani, C
,
Burns, S D
,
Stamper, A D
,
Nafisi, K
,
Brodsky, C J
,
Fan, S S
,
Kini, S
,
Hahn, R
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