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Search Results - Tempest, S.L.
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1.8 million transistor CMOS ASIC fabricated in a SiGe BiCMOS technology
by
Johnson, R.A.
,
Zierak, M.J.
,
Outama, K.B.
,
Bahn, T.C.
,
Joseph, A.J.
,
Cordero, C.N.
,
Malinowski, J.
,
Bard, K.A.
,
Weeks, T.W.
,
Milliken, R.A.
,
Medve, T.J.
,
May, G.A.
,
Chong, W.
,
Walter, K.M.
,
Tempest, S.L.
,
Chau, B.B.
,
Boenke, M.
,
Nelson, M.W.
,
Harame, D.L.
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Electrical integrity of state-of-the-art 0.13 /spl mu/m SOI CMOS devices and circuits transferred for three-dimensional (3D) integrated circuit (IC) fabrication
by
Guarini, K.W.
,
Topol, A.W.
,
Ieong, M.
,
Yu, R.
,
Shi, L.
,
Newport, M.R.
,
Frank, D.J.
,
Singh, D.V.
,
Cohen, G.M.
,
Nitta, S.V.
,
Boyd, D.C.
,
O'Neil, P.A.
,
Tempest, S.L.
,
Pogge, H.B.
,
Purushothaman, S.
,
Haensch, W.E.
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Conference Proceedings
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Circuit Testing
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Application Specific Integrated Circuits
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Bicmos Integrated Circuits
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Bicmos-Technologie
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Bipolar Transistor Circuits
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Cmos Integrated Circuits
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Cmos Technology
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Elektrostatische Entladung
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Engineering
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Engineering, Electrical & Electronic
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Fabrication
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Germanium Silicon Alloys
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Glass
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Heterojunction Bipolar Transistors
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Integrated Circuit Interconnections
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Integrierte Bicmos-Schaltung
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Integrierte Gemischte Analog-Digital-Schaltung
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Integrierte Schaltungsausbeute
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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