Search Results - Tenner, Vasco T

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  1. 1
    Impact of coherence length on the field of view in dark-field holographic microscopy for semiconductor metrology: theoretical and experimental comparisons

    Impact of coherence length on the field of view in dark-field holographic microscopy for semiconductor metrology: theoretical and experimental comparisons by Messinis, Christos, Tenner, Vasco T, De Boer, Johannes F, Witte, Stefan, den Boef, Arie

    Published in Applied optics (2004)
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  2. 2
    Lensless diffractive imaging with ultra-broadband table-top sources: from infrared to extreme-ultraviolet wavelengths

    Lensless diffractive imaging with ultra-broadband table-top sources: from infrared to extreme-ultraviolet wavelengths by Witte, Stefan, Tenner, Vasco T, Noom, Daniel WE, Eikema, Kjeld SE

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  3. 3
    Diffraction-based overlay metrology using angular-multiplexed acquisition of dark-field digital holograms

    Diffraction-based overlay metrology using angular-multiplexed acquisition of dark-field digital holograms by Messinis, Christos, van Schaijk, Theodorus T M, Pandey, Nitesh, Tenner, Vasco T, Witte, Stefan, de Boer, Johannes F, den Boef, Arie

    Published in Optics express
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  4. 4
    Fourier transform holography with extended references using a coherent ultra-broadband light source

    Fourier transform holography with extended references using a coherent ultra-broadband light source by Tenner, Vasco T, Eikema, Kjeld S E, Witte, Stefan

    Published in Optics express
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  5. 5
    Uncertainty Estimation and Design Optimization of 2D Diffraction-Based Overlay Metrology Targets

    Uncertainty Estimation and Design Optimization of 2D Diffraction-Based Overlay Metrology Targets by Röhrich, Ruslan, Oliveri, Giorgio, Kovaios, Stefanos, Tenner, Vasco T, den Boef, Arie J, Overvelde, Johannes T. B, Koenderink, A. Femius

    Published in ACS photonics
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  6. 6
    Measurement of the Phase and Intensity Profile of Surface Plasmon Laser Emission

    Measurement of the Phase and Intensity Profile of Surface Plasmon Laser Emission by Tenner, Vasco T, de Dood, Michiel J. A, van Exter, Martin P

    Published in ACS photonics
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  7. 7
    Ultra-broadband extreme-ultraviolet lensless imaging of extended complex structures

    Ultra-broadband extreme-ultraviolet lensless imaging of extended complex structures by Witte, Stefan, Tenner, Vasco T, Noom, Daniël W E, Eikema, Kjeld S E

    Published in arXiv.org
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