Showing
1 - 5
results of
5
Skip to content
VuFind
Log in
Library Catalogue Plus
Library
Subject guides
Databases
Referencing
Catalogue
Articles Plus
Keyword
Title
Author
Subject
Find
Advanced Search
Search Results - Thapar, Dhruv
Search Results - Thapar, Dhruv
Showing
1 - 5
results of
5
Refine Results
Sort
Relevance
Date Descending
Author
Title
1
Loading…
Defect Analysis for FeFETs using a Compact Model
by
Thapar, Dhruv
,
Chaudhuri, Arjun
,
Ni, Kai
,
Chakrabarty, Krishnendu
Request full text
Conference Proceeding
Save to List
Saved in:
2
Loading…
Analysis and Characterization of Defects in FeFETs
by
Thapar, Dhruv
,
Thomann, Simon
,
Chaudhuri, Arjun
,
Amrouch, Hussam
,
Chakrabarty, Krishnendu
Request full text
Conference Proceeding
Save to List
Saved in:
3
Loading…
Safety-Guided Test Generation for Structural Faults
by
Tan, Xuanyi
,
Thapar, Dhruv
,
Sahoo, Deepesh
,
Chaudhuri, Arjun
,
Banerjee, Sanmitra
,
Chakrabarty, Krishnendu
,
Parekhji, Rubin
Request full text
Conference Proceeding
Save to List
Saved in:
4
Loading…
SPICED: Syntactical Bug and Trojan Pattern Identification in A/MS Circuits using LLM-Enhanced Detection
by
Chaudhuri, Jayeeta
,
Thapar, Dhruv
,
Chaudhuri, Arjun
,
Firouzi, Farshad
,
Chakrabarty, Krishnendu
Published in
arXiv.org
Get full text
Article
Save to List
Saved in:
5
Loading…
Adaptive Multi-bit SRAM Topology Based Analog PUF
by
Sharma, Sudarshan
,
Thapar, Dhruv
,
Bhelave, Nikhil
,
Mrigank Sharad
Published in
arXiv.org
Get full text
Article
Save to List
Saved in:
Search Tools:
RSS Feed
Email Search
Save Search
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit To
Full Text
5 results
5
Format
Conference Proceedings
3 results
3
Articles
2 results
2
Subjects
Computational Modeling
2 results
2
Machine Learning
2 results
2
Analog Circuits
1 results
1
Analytical Models
1 results
1
Anomalies
1 results
1
Benchmark Testing
1 results
1
Capacitors
1 results
1
Circuit Faults
1 results
1
Circuits
1 results
1
Cryptography
1 results
1
Current Mirrors
1 results
1
Data Models
1 results
1
Fabrication
1 results
1
Fault Characterization
1 results
1
Fefet
1 results
1
Fefets
1 results
1
Ferroelectric Materials
1 results
1
Ferroelectricity
1 results
1
Field Effect Transistors
1 results
1
Foundries
1 results
1
Year of Publication
From:
To:
Source
Ieee Electronic Library (Iel) Conference Proceedings
3 results
3
Ieee Xplore All Conference Series
3 results
3
Open Access: Freely Accessible Journals By Multiple Vendors
2 results
2
Road
2 results
2
Publicly Available Content Database (Proquest) (Pq Sdu P3)
2 results
2