Search Results - Thinakaran, Rajavelu

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  1. 1
    Low cost dynamic error detection in linearity testing of SAR ADCs

    Low cost dynamic error detection in linearity testing of SAR ADCs by Jain, Nimit, Agarwal, Nitin, Thinakaran, Rajavelu, Parekhji, Rubin

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    Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter

    Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter by Li Xu, Yuming Zhuang, Thinakaran, Rajavelu, Butler, Kenneth M., Degang Chen

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    A low power high speed envelope detector for serial data systems in 45nm CMOS

    A low power high speed envelope detector for serial data systems in 45nm CMOS by Seth, Sumantra, Thinakaran, Rajavelu, Chakravarty, Sujoy, Sinha, Vikas

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