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Thermal characterization of vertical multichip modules MCM-V
by
Cahill, C.
,
Compagno, A.
,
O'Donovan, J.
,
Slattery, O.
,
O'Mathuna, S.C.
,
Barrett, J.
,
Serthelon, I.
,
Val, C.
,
Tigners, J.-P.
,
Stern, J.
,
Ivey, P.
,
Masgrangeas, M.
,
Coello-Vera, A.
Published in
IEEE transactions on components, packaging, and manufacturing technology. Part A
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Ieee Transactions On Components, Packaging, And Manufacturing Technology. Part A
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Ieee Transactions On Components, Packaging, And Manufacturing Technology: Part A
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Subjects
Electronics Packaging
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Engineering
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Engineering, Electrical & Electronic
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Engineering, Manufacturing
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General Engineering
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Heat Resistance
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Image Processing
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Integrated Circuit Layout
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Manufacturing Processes
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Materials Science
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Materials Science, Multidisciplinary
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Multichip Modules
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Packaging
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Plastics
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Science & Technology
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Semiconductor Device Measurement
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Sheet Molding Compounds
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Size Measurement
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Steady-State
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Technology
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Ieee Electronic Library (Iel) Journals
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