Search Results - Tokas, Raj B.

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  1. 1
    Characterization of electron beam deposited Al2O3MgO thin films

    Characterization of electron beam deposited Al2O3MgO thin films by Tokas, Raj B., Jena, Shuvendu, Thakur, Sudhakar

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  2. 2
    Investigations on Substrate Temperature-Induced Growth Modes of Organic Semiconductors at Dielectric/semiconductor Interface and Their Correlation with Threshold Voltage Stability in Organic Field-Effect Transistors

    Investigations on Substrate Temperature-Induced Growth Modes of Organic Semiconductors at Dielectric/semiconductor Interface and Their Correlation with Threshold Voltage Stability... by Padma, Narayanan, Maheshwari, Priya, Bhattacharya, Debarati, Tokas, Raj B, Sen, Shashwati, Honda, Yoshihide, Basu, Saibal, Pujari, Pradeep Kumar, Rao, T. V. Chandrasekhar

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    Growth-dependent refractive index nonlinearity and mean microstructural properties of codeposited composite gadolinia silica films

    Growth-dependent refractive index nonlinearity and mean microstructural properties of codeposited composite gadolinia silica films by Sahoo, Naba K, Thakur, Sudhakar, Tokas, Raj B

    Published in Applied optics (2004)
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  4. 4
    Postanalyses of an optical multilayer interference filter using numerical reverse synthesis and Rutherford backscattering spectrometry

    Postanalyses of an optical multilayer interference filter using numerical reverse synthesis and Rutherford backscattering spectrometry by Sahoo, Naba Kishore, Kumar, Sanjiv, Tokas, Raj Bahadur, Jena, Shuvendu, Thakur, Sudhakar, Reddy, Gundlapally Laxmi Narasimha

    Published in Applied optics (2004)
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