Showing
1 - 1
results of
1
Skip to content
VuFind
Log in
Library Catalogue Plus
Library
Subject guides
Databases
Referencing
Catalogue
Articles Plus
Keyword
Title
Author
Subject
Find
Advanced Search
Search Results - Tong Wei Kit, Schumann
Search Results - Tong Wei Kit, Schumann
Showing
1 - 1
results of
1
Refine Results
Sort
Relevance
Date Descending
Author
Title
1
Loading…
Fast retrievals of test-pad coordinates from photo images of printed circuit boards
by
Swee Chuan Tan
,
Tong Wei Kit, Schumann
Request full text
Conference Proceeding
Save to List
Saved in:
Search Tools:
RSS Feed
Email Search
Save Search
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit To
Full Text
1 results
1
Format
Conference Proceedings
1 results
1
Subjects
Clustering
1 results
1
Computer Science
1 results
1
Computer Science, Cybernetics
1 results
1
Data Mining
1 results
1
Electronic Circuits
1 results
1
Engineering
1 results
1
Engineering, Electrical & Electronic
1 results
1
Engineering, Mechanical
1 results
1
Flying Probe Tester
1 results
1
Image Analysis
1 results
1
Image Color Analysis
1 results
1
Printed Circuit Board
1 results
1
Printed Circuits
1 results
1
Probes
1 results
1
Reverse Engineering
1 results
1
Robots
1 results
1
Science & Technology
1 results
1
Technology
1 results
1
Testing
1 results
1
Year of Publication
From:
To:
Source
Ieee Electronic Library (Iel) Conference Proceedings
1 results
1
Ieee Xplore All Conference Series
1 results
1