Surveyed impact of intellectual property training in STEM education on innovation, research, and development by O'Sullivan, S, Friebe, Michael, Tonti, W. R, Hartnett, Margaret, Castro, Manuel, Pozzo, M. I, Nilsiam, Y

Get full text

eFuse Design and Reliability by Tonti, W.R.

Request full text

A submicron MOSFET parameter extraction technique by EL-KAREH, B, TONTI, W. R, TITCOMB, S. L

Get full text

Long-term bias temperature reliability of P+ polysilicon gated FET devices by ABADEER, W. W, TONTI, W. R, HÄNSCH, W. E, SCHWALKE, U

Get full text

Technology Navigator: A tool for zoning in by Wiesner, P, Tonti, W R, Tear, A, Laplante, P, Patel, D, Sumner, R, Flescher, H

Request full text

Reliability, design qualification, and prognostic opportunity of in die E-Fuse by Tonti, W. R.

Request full text

Long-term bias temperature reliability of P(+) polysilicongated FET devices by Abadeer, W W, Tonti, W R, Hansch, W E, Schwalke, U

Get full text

MOS Technology Drivers by Tonti, W.R.

Get full text

Design of submicron PMOSFETs for DRAM array applications by El-Kareh, B., Abadeer, W.W., Tonti, W.R.

Request full text

Device design methodology and reliability strategy for deep sub-micron technology [DRAMs] by Divakaruni, R., El-Kareh, B., Tonti, W.R.

Request full text

Product specific sub-micron E-fuse reliability and design qualification by Tont, W.Ri, Fifield, J.A., Higgins, J., Guthrie, W.H., Berry, W., Narayan, C.

Request full text

Doping profile design for substrate hot carrier reliability in deep submicron field effect transistors by Tonti, W.R., Noble, W.P., Abadeer, W.W., Mittl, S.W., Haensch, W.E.

Request full text

On the road to ITER NBIs: SPIDER improvement after first operation and MITICA construction progress by Toigo, V., Serianni, G., Boldrin, M., Chitarin, G., Bello, S. Dal, Grando, L., Pasqualotto, R., Zaccaria, P., Agnello, R., Agostinetti, P., Agostini, M., Aprile, D., Barbisan, M., Berton, G., Bigi, M., Brombin, M., Canton, A., Casagrande, R., Cavallini, C., Cordaro, L., Cruz, N., Palma, M. Dalla, Dan, M., De Lorenzi, A., Delogu, R., Denizeau, S., Ferro, A., Gaio, E., Gasparrini, C., Gnesotto, F., Jain, P., Lorenzini, R., Maistrello, A., Manduchi, G., Manfrin, S., Martini, S., Patton, T., Pavei, M., Peruzzo, S., Pimazzoni, A., Poggi, C., Pouradier-Duteil, B., Recchia, M., Rigoni-Garola, A., Sartori, E., Shepherd, A., Siragusa, M., Sonato, P., Spada, E., Taliercio, C., Terranova, D., Tinti, P., Tomsič, P., Valente, M., Vignando, M., Zamengo, A., Zaniol, B., Zaupa, M., Zuin, M., Cavenago, M., Boilson, D., Rotti, C., Decamps, H., Dremel, M., Graceffa, J., Geli, F., Urbani, M., Zacks, J., Bonicelli, T., Paolucci, F., Garbuglia, A., Gomez, G., Kouzmenko, G., Labate, C., Masiello, A., Mico, G., Moreno, J-F, Simon, M., Kashiwagi, M., Tobari, H., Maejima, T., Yamashita, Y., Singh, M., Singh, N.P., Fantz, U., Bonomo, F., Cristofaro, S., Heinemann, B., Kraus, W., Fubiani, G., Tsumori, K., Croci, G., Tardocchi, M., Giacomelli, L., Rigamonti, D., Taccogna, F., Bruno, D., Rutigliano, M., Tonti, A., Panin, F.

Get full text

STAR: an integrated solution to management and visualization of sequencing data by Wang, Tao, Liu, Jie, Shen, Li, Tonti-Filippini, Julian, Zhu, Yun, Jia, Haiyang, Lister, Ryan, Whitaker, John W, Ecker, Joseph R, Millar, A Harvey, Ren, Bing, Wang, Wei

Get full text

P544 Ustekinumab safety and effectiveness in ulcerative colitis patients: results from a large real-life study by Mocci, G, Scaldaferri, F, Pugliese, D, Savarino, E, Bodini, G, Cuomo, A, Donnarumma, L, Maconi, G, Cataletti, G, Rodino, S, Sebkova, L, Ferronato, A, Gaiani, F, Marzo, M, Luppino, I, Paese, P, Elisei, W, Monterubbianesi, R, Faggiani, R, Napolitano, D, Grossi, L, Serio, M, Scarcelli, A, Lorenzetti, R, Allegretta, L, Rocco, G, Zampaletta, C, Bolognini, L, Meucci, C, Colucci, R, Tonti, P, Della Valle, N, Piga, R, Forti, G, Onidi, F M, Usai Satta, P, Picchio, M, Papa, A, Tursi, A

Get full text

Electronic passivation of Si(111) by Ga–Se half-sheet termination by Fritsche, R., Wisotzki, E., Islam, A. B. M. O., Thissen, A., Klein, A., Jaegermann, W., Rudolph, R., Tonti, D., Pettenkofer, C.

Get full text

Preparation of a Si( [formula omitted]):GaSe van der Waals surface termination by selenization of a monolayer Ga on Si( [formula omitted]) by Fritsche, R., Wisotzki, E., Thißen, A., Islam, A.B.M.O., Klein, A., Jaegermann, W., Rudolph, R., Tonti, D., Pettenkofer, C.

Get full text

Risk factors for type 2 diabetes in women attending menopause clinics in Italy: a cross-sectional study by Di Donato, P, Giulini, N A, Bacchi Modena, A, Cicchetti, G, Comitini, G, Gentile, G, Cristiani, P, Careccia, A, Esposito, E, Gualdi, F, Golinelli, S, Bergamini, E, Masellis, G, Rastelli, S, Gigli, C, Elia, A, Marchesoni, D, Sticotti, F, Del Frate, G, Zompicchiatti, C, Marino, L, Costa, M R, Pinto, P, Dodero, D, Storace, A, Spinelli, G, Quaranta, S, Bossi, C M, Ollago, A, Omodei, U, Vaccari, M, Luerti, M, Repetti, F, Zandonini, G, Raspagliesi, F, Dolci, F, Gambarino, G, De Pasquale, B, Polizzotti, G, Borsellino, G, Alpinelli, P, Natale, N, Colombo, D, Belloni, C, Viani, A, Cecchini, G, Vinci, G W, Samaja, B A, Pasinetti, E, Penotti, M, Ognissanti, F, Pesando, P, Malanetto, C, Gallo, M, Dolfin, G, Tartaglino, P, Mossotto, D, Pistoni, A, Tarani, A, Rattazzi, P D, Rossaro, D, Campanella, M, Arisi, E, Gamper, M, Salvatores, D, Bocchin, E, Stellin, G, Meli, G, Azzini, V, Tirozzi, F, Buoso, G, Fraioli, R, Marsoni, V, Cetera, C, Sposetti, R, Candiotto, E, Pignalosa, R, Del Pup, L, Bellati, U, Angeloni, C, Buonerba, M, Garzarelli, S, Santilli, C, Mucci, M, Di Nisio, Q, Cappa, F, Pierangeli, I, Cordone, A, Falasca, L, Ferrante, D, Serra, G B, Cirese, E, Todaro, P A, Romanini, C, Spagnuolo, L, Lanzone, A, Donadio, C, Fabiani, M, Baldaccini, E, Votano, S

Get full text

Improving the accuracy of "Shift and Ratio" channel length extraction method in deep submicron technology by Qiuyi Ye, Yujun Li, Tonti, W., Berry, W., Parks, C., Mohler, R.

Request full text

Impact of shallow trench isolation on reliability of buried- and surface-channel sub-/spl mu/m PFET by Tonti, W., Bolam, R., Hansch, W.

Request full text