Search Results - Torkanov, V.

  • Showing 1 - 4 results of 4
Refine Results
  1. 1
    Metal-oxide-semiconductor capacitors on GaAs with high- k gate oxide and amorphous silicon interface passivation layer

    Metal-oxide-semiconductor capacitors on GaAs with high- k gate oxide and amorphous silicon interface passivation layer by Koveshnikov, S., Tsai, W., Ok, I., Lee, J. C., Torkanov, V., Yakimov, M., Oktyabrsky, S.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Metal-oxide-semiconductor capacitors on GaAs with high- k gate oxideand amorphous silicon interface passivation layer

    Metal-oxide-semiconductor capacitors on GaAs with high- k gate oxideand amorphous silicon interface passivation layer by Koveshnikov, S., Tsai, W., Ok, I., Lee, J. C., Torkanov, V., Yakimov, M., Oktyabrsky, S.

    Get full text
    Items that this one cites
    Article
    Save to List
    Saved in:
  3. 3
    Importance of controlling oxygen incorporation into HfO2∕Si∕n-GaAs gate stacks

    Importance of controlling oxygen incorporation into HfO2∕Si∕n-GaAs gate stacks by Zhang, M. H., Oye, M., Cobb, B., Zhu, F., Kim, H. S., Ok, I. J., Hurst, J., Lewis, S., Holmes, A., Lee, J. C., Koveshnikov, S., Tsai, W., Yakimov, M., Torkanov, V., Oktyabrsky, S.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  4. 4
    Importance of controlling oxygen incorporation into Hf O 2 ∕ Si ∕ n - Ga As gate stacks

    Importance of controlling oxygen incorporation into Hf O 2 ∕ Si ∕ n - Ga As gate stacks by Zhang, M. H., Oye, M., Cobb, B., Zhu, F., Kim, H. S., Ok, I. J., Hurst, J., Lewis, S., Holmes, A., Lee, J. C., Koveshnikov, S., Tsai, W., Yakimov, M., Torkanov, V., Oktyabrsky, S.

    Get full text
    Items that this one cites
    Article
    Save to List
    Saved in:

Search Tools: