Search Results - Touryanski, A.G.

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  1. 1
    Two-wave X-ray optical diagnostics of Ge xSi 1− x/Si modulation-doped heterostructures

    Two-wave X-ray optical diagnostics of Ge xSi 1− x/Si modulation-doped heterostructures by Touryanski, A.G, Pirshin, I.V, Rzaev, M.A, Schäffler, F, Mühlberger, M

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  2. 2
    Two-channel X-ray reflectometer

    Two-channel X-ray reflectometer by Touryanski, A.G, Vinogradov, A.V, Pirshin, I.V

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  3. 3
    Two-wave X-ray optical diagnostics of GexSi1−x/Si modulation-doped heterostructures

    Two-wave X-ray optical diagnostics of GexSi1−x/Si modulation-doped heterostructures by Touryanski, A.G, Pirshin, I.V, Rzaev, M.A, Schäffler, F, Mühlberger, M

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  4. 4
    Application of the Statistical Dynamical Theory of X-Ray Diffraction to Calculation of the HOPG Echelon-Monochromator Parameters

    Application of the Statistical Dynamical Theory of X-Ray Diffraction to Calculation of the HOPG Echelon-Monochromator Parameters by Nesterets, Ya.I., Punegov, V.I., Pirshin, I.V., Touryanski, A.G., Vinogradov, A.V., Förster, E., Podorov, S.G.

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