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Batch process for atomic layer deposition of hafnium silicate thin films on 300-mm-diameter silicon substrates
by
Okuyama, Yoshi
,
Barelli, Carl
,
Tousseau, Christopher
,
Park, Seung
,
Senzaki, Yoshihide
Published in
Journal of vacuum science & technology. A, Vacuum, surfaces, and films
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Batch process for atomic layer deposition of hafnium silicate thin filmson 300-mm-diameter silicon substrates
by
Okuyama, Yoshi
,
Barelli, Carl
,
Tousseau, Christopher
,
Park, Seung
,
Senzaki, Yoshihide
Published in
Journal of vacuum science & technology. A, Vacuum, surfaces, and films
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Atomic layer deposition of high-k thin films for gate and capacitor dielectrics
by
Senzaki, Y.
,
Chatham, H.
,
Park, S.
,
Bartholomew, L.
,
Lo, T.
,
Okuyama, Y.
,
Barelli, C.
,
Tousseau, C.
,
Fleming, T.
,
Ford, B.
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Journal Of Vacuum Science & Technology. A, Vacuum, Surfaces, And Films
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Materials Science
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Atomic Layer Deposition
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Dielectric Thin Films
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Hafnium Oxide
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High K Dielectric Materials
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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