Search Results - Toutam, V.K.

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    Evaluation of depth distribution and characterization of nanoscale Ta/Si multilayer thin film structures

    Evaluation of depth distribution and characterization of nanoscale Ta/Si multilayer thin film structures by Chakraborty, B.R., Halder, S.K., Maurya, K.K., Srivastava, A.K., Toutam, V.K., Dalai, M.K., Sehgal, G., Singh, S.

    Published in Thin solid films
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