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Search Results - Tritchkov, A.
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Sub-resolution feature OPC as an enabler for manufacturing at 0.2μm and below
by
Randall, J.
,
Tritchkov, A.
,
Ronse, K.
,
Jaenen, P.
Published in
Microelectronic engineering
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Feasibility of 250 nm gate patterning using i-line with OPC
by
Van Driessche, V.
,
Finders, J.
,
Tritchkov, A.
,
Ronse, K.
,
Van den hove, L.
,
Tzviatkov, P.
Published in
Microelectronic engineering
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Lithography simulation with aerial image — Variable threshold resist model
by
Randall, John
,
Gangala, Hareen
,
Tritchkov, Alexander
Published in
Microelectronic engineering
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Proximity Effects Correction for Advanced Optical Lithography Processes
by
Tritchkov, Alexander
,
Finders, Jo
,
Randall, John
,
Ronse, Kurt
,
Vandenhove, Luc
Published in
Japanese Journal of Applied Physics
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Systematic Mapping Study on Verification and Validation of Industrial Third-party Iot Applications
by
Tritchkov, Ivan
Published in
Advances in Cyber-Physical Systems
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Study on various curvilinear data representations and their impact on mask and wafer manufacturing
by
Choi, Jin
,
Ryu, Soo
,
Lee, Sukho
,
Kim, Minah
,
Park, JoonSoo
,
Buck, Peter
,
Bork, Ingo
,
Durvasula, Bhardwaj
,
Gharat, Sayalee
,
Rao, Nageswara
,
Pai, Ravi
,
Koranne, Sandeep
,
Tritchkov, Alexander
Published in
Journal of micro/nanolithography, MEMS, and MOEMS
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An efficient approach for computing residual stresses in welded joints
by
Sarkani, Shahram
,
Tritchkov, Vesselin
,
Michaelov, George
Published in
Finite elements in analysis and design
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Computational lithography: Exhausting the resolution limits of 193-nm projection lithography systems
by
Melville, David O. S.
,
Rosenbluth, Alan E.
,
Waechter, Andreas
,
Millstone, Marc
,
Tirapu-Azpiroz, Jaione
,
Tian, Kehan
,
Lai, Kafai
,
Inoue, Tadanobu
,
Sakamoto, Masaharu
,
Adam, Kostas
,
Tritchkov, Alexander
Published in
Journal of vacuum science and technology. B, Nanotechnology & microelectronics
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Vibration control of structures using adjustable slippage elements
by
TRITCHKOV, V
,
MICHAELOV, G
,
SARKANI, S
Published in
Engineering structures
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